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Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy
Real-space images of polymers with sub-molecular resolution could provide valuable insights into the relationship between morphology and functionality of polymer optoelectronic devices, but their acquisition is problematic due to perceived limitations in atomic force microscopy (AFM). We show that i...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6449331/ https://www.ncbi.nlm.nih.gov/pubmed/30948725 http://dx.doi.org/10.1038/s41467-019-09571-6 |