Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy

Real-space images of polymers with sub-molecular resolution could provide valuable insights into the relationship between morphology and functionality of polymer optoelectronic devices, but their acquisition is problematic due to perceived limitations in atomic force microscopy (AFM). We show that i...

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Detalles Bibliográficos
Autores principales: Korolkov, Vladimir V., Summerfield, Alex, Murphy, Alanna, Amabilino, David B., Watanabe, Kenji, Taniguchi, Takashi, Beton, Peter H.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6449331/
https://www.ncbi.nlm.nih.gov/pubmed/30948725
http://dx.doi.org/10.1038/s41467-019-09571-6

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