Inception of electronic damage of matter by photon-driven post-ionization mechanisms

“Probe-before-destroy” methodology permitted diffraction and imaging measurements of intact specimens using ultrabright but highly destructive X-ray free-electron laser (XFEL) pulses. The methodology takes advantage of XFEL pulses ultrashort duration to outrun the destructive nature of the X-rays. A...

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Detalles Bibliográficos
Autores principales: Błachucki, W., Kayser, Y., Czapla-Masztafiak, J., Guo, M., Juranić, P., Kavčič, M., Källman, E., Knopp, G., Lundberg, M., Milne, C., Rehanek, J., Sá, J., Szlachetko, J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2019
Materias:
ARTICLES
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6450797/
https://www.ncbi.nlm.nih.gov/pubmed/31041363
http://dx.doi.org/10.1063/1.5090332

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6450797/
https://www.ncbi.nlm.nih.gov/pubmed/31041363
http://dx.doi.org/10.1063/1.5090332

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