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Inception of electronic damage of matter by photon-driven post-ionization mechanisms

“Probe-before-destroy” methodology permitted diffraction and imaging measurements of intact specimens using ultrabright but highly destructive X-ray free-electron laser (XFEL) pulses. The methodology takes advantage of XFEL pulses ultrashort duration to outrun the destructive nature of the X-rays. A...

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Autores principales: Błachucki, W., Kayser, Y., Czapla-Masztafiak, J., Guo, M., Juranić, P., Kavčič, M., Källman, E., Knopp, G., Lundberg, M., Milne, C., Rehanek, J., Sá, J., Szlachetko, J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6450797/
https://www.ncbi.nlm.nih.gov/pubmed/31041363
http://dx.doi.org/10.1063/1.5090332
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author Błachucki, W.
Kayser, Y.
Czapla-Masztafiak, J.
Guo, M.
Juranić, P.
Kavčič, M.
Källman, E.
Knopp, G.
Lundberg, M.
Milne, C.
Rehanek, J.
Sá, J.
Szlachetko, J.
author_facet Błachucki, W.
Kayser, Y.
Czapla-Masztafiak, J.
Guo, M.
Juranić, P.
Kavčič, M.
Källman, E.
Knopp, G.
Lundberg, M.
Milne, C.
Rehanek, J.
Sá, J.
Szlachetko, J.
author_sort Błachucki, W.
collection PubMed
description “Probe-before-destroy” methodology permitted diffraction and imaging measurements of intact specimens using ultrabright but highly destructive X-ray free-electron laser (XFEL) pulses. The methodology takes advantage of XFEL pulses ultrashort duration to outrun the destructive nature of the X-rays. Atomic movement, generally on the order of >50 fs, regulates the maximum pulse duration for intact specimen measurements. In this contribution, we report the electronic structure damage of a molecule with ultrashort X-ray pulses under preservation of the atoms' positions. A detailed investigation of the X-ray induced processes revealed that X-ray absorption events in the solvent produce a significant number of solvated electrons within attosecond and femtosecond timescales that are capable of coulombic interactions with the probed molecules. The presented findings show a strong influence on the experimental spectra coming from ionization of the probed atoms' surroundings leading to electronic structure modification much faster than direct absorption of photons. This work calls for consideration of this phenomenon in cases focused on samples embedded in, e.g., solutions or in matrices, which in fact concerns most of the experimental studies.
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spelling pubmed-64507972019-04-30 Inception of electronic damage of matter by photon-driven post-ionization mechanisms Błachucki, W. Kayser, Y. Czapla-Masztafiak, J. Guo, M. Juranić, P. Kavčič, M. Källman, E. Knopp, G. Lundberg, M. Milne, C. Rehanek, J. Sá, J. Szlachetko, J. Struct Dyn ARTICLES “Probe-before-destroy” methodology permitted diffraction and imaging measurements of intact specimens using ultrabright but highly destructive X-ray free-electron laser (XFEL) pulses. The methodology takes advantage of XFEL pulses ultrashort duration to outrun the destructive nature of the X-rays. Atomic movement, generally on the order of >50 fs, regulates the maximum pulse duration for intact specimen measurements. In this contribution, we report the electronic structure damage of a molecule with ultrashort X-ray pulses under preservation of the atoms' positions. A detailed investigation of the X-ray induced processes revealed that X-ray absorption events in the solvent produce a significant number of solvated electrons within attosecond and femtosecond timescales that are capable of coulombic interactions with the probed molecules. The presented findings show a strong influence on the experimental spectra coming from ionization of the probed atoms' surroundings leading to electronic structure modification much faster than direct absorption of photons. This work calls for consideration of this phenomenon in cases focused on samples embedded in, e.g., solutions or in matrices, which in fact concerns most of the experimental studies. American Crystallographic Association 2019-04-05 /pmc/articles/PMC6450797/ /pubmed/31041363 http://dx.doi.org/10.1063/1.5090332 Text en © 2019 Author(s). 2329-7778/2019/6(2)/ 024901/8 All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle ARTICLES
Błachucki, W.
Kayser, Y.
Czapla-Masztafiak, J.
Guo, M.
Juranić, P.
Kavčič, M.
Källman, E.
Knopp, G.
Lundberg, M.
Milne, C.
Rehanek, J.
Sá, J.
Szlachetko, J.
Inception of electronic damage of matter by photon-driven post-ionization mechanisms
title Inception of electronic damage of matter by photon-driven post-ionization mechanisms
title_full Inception of electronic damage of matter by photon-driven post-ionization mechanisms
title_fullStr Inception of electronic damage of matter by photon-driven post-ionization mechanisms
title_full_unstemmed Inception of electronic damage of matter by photon-driven post-ionization mechanisms
title_short Inception of electronic damage of matter by photon-driven post-ionization mechanisms
title_sort inception of electronic damage of matter by photon-driven post-ionization mechanisms
topic ARTICLES
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6450797/
https://www.ncbi.nlm.nih.gov/pubmed/31041363
http://dx.doi.org/10.1063/1.5090332
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