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Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor
We present the photo-induced force microscopy (PiFM) studies of various nano-materials by implementing a quartz tuning fork (QTF), a self-sensing sensor that does not require complex optics to detect the motion of a force probe and thus helps to compactly configure the nanoscale optical mapping tool...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6480011/ https://www.ncbi.nlm.nih.gov/pubmed/30934843 http://dx.doi.org/10.3390/s19071530 |