Short range biaxial strain relief mechanism within epitaxially grown BiFeO(3)

Lattice mismatch-induced biaxial strain effect on the crystal structure and growth mechanism is investigated for the BiFeO(3) films grown on La(0.6)Sr(0.4)MnO(3)/SrTiO(3) and YAlO(3) substrates. Nano-beam electron diffraction, structure factor calculation and x-ray reciprocal space mapping unambiguo...

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Detalles Bibliográficos
Autores principales: Bae, In-Tae, Yasui, Shintaro, Ichinose, Tomohiro, Itoh, Mitsuru, Shiraishi, Takahisa, Kiguchi, Takanori, Naganuma, Hiroshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6491549/
https://www.ncbi.nlm.nih.gov/pubmed/31040305
http://dx.doi.org/10.1038/s41598-019-42998-x

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6491549/
https://www.ncbi.nlm.nih.gov/pubmed/31040305
http://dx.doi.org/10.1038/s41598-019-42998-x

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