High spectral resolution second harmonic generation microspectroscopy at thin layer interfaces with broadband continuum pulses

We demonstrate an effective microspectroscopy technique by tracing the dispersion of second order nonlinear optical susceptibility χ((2)) in single atomic layer materials. The experimental method relies on the detection of single-shot second harmonic (SH) spectra from the materials and the subsequen...

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Detalles Bibliográficos
Autores principales: Mokim, M., Card, A., Ganikhanov, F.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2019
Materias:
Materials Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6500909/
https://www.ncbi.nlm.nih.gov/pubmed/31080755
http://dx.doi.org/10.1016/j.mex.2019.04.015

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6500909/
https://www.ncbi.nlm.nih.gov/pubmed/31080755
http://dx.doi.org/10.1016/j.mex.2019.04.015

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