Experimental steering of electron microscopy studies using prior X-ray computed tomography

Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) can provide unrivalled high-resolution images of specific features and volumes of interest. However, the regions interrogated are typically very small, and sample preparation is both time-consuming and destructive. Here we...

Descripción completa

Detalles Bibliográficos
Autores principales: Starborg, Tobias, O'Sullivan, James D.B., Carneiro, Claudia Martins, Behnsen, Julia, Else, Kathryn J., Grencis, Richard K., Withers, Philip J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6504073/
https://www.ncbi.nlm.nih.gov/pubmed/30928781
http://dx.doi.org/10.1016/j.ultramic.2019.03.002

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6504073/
https://www.ncbi.nlm.nih.gov/pubmed/30928781
http://dx.doi.org/10.1016/j.ultramic.2019.03.002

Ejemplares similares