A statistical approach to correct X-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements

An unbiased approach to correct X-ray response non-uniformity in microstrip detectors has been developed based on the statistical estimation that the scattering intensity at a fixed angle from an object is expected to be constant within the Poisson noise. Raw scattering data of SiO(2) glass measured...

Descripción completa

Detalles Bibliográficos
Autores principales: Kato, Kenichi, Tanaka, Yoshihito, Yamauchi, Miho, Ohara, Koji, Hatsui, Takaki
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6510202/
https://www.ncbi.nlm.nih.gov/pubmed/31074441
http://dx.doi.org/10.1107/S1600577519002145

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6510202/
https://www.ncbi.nlm.nih.gov/pubmed/31074441
http://dx.doi.org/10.1107/S1600577519002145

Ejemplares similares