Crystallographic contributions to piezoelectric properties in PZT thin films

We report on the correlated investigation between macroscopic piezoelectric properties and the microscopic deformation of crystal structures of both epitaxial and polycrystalline Pb(Zr,Ti)O(3) (PZT) thin films grown on MgO and Si substrates, respectively. We observed the reversible elongation and co...

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Detalles Bibliográficos
Autores principales: Tan, Goon, Maruyama, Kazuki, Kanamitsu, Yuya, Nishioka, Shintaro, Ozaki, Tomoatsu, Umegaki, Toshihito, Hida, Hirotaka, Kanno, Isaku
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6514214/
https://www.ncbi.nlm.nih.gov/pubmed/31086266
http://dx.doi.org/10.1038/s41598-019-43869-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6514214/
https://www.ncbi.nlm.nih.gov/pubmed/31086266
http://dx.doi.org/10.1038/s41598-019-43869-1

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