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Crystallographic contributions to piezoelectric properties in PZT thin films
We report on the correlated investigation between macroscopic piezoelectric properties and the microscopic deformation of crystal structures of both epitaxial and polycrystalline Pb(Zr,Ti)O(3) (PZT) thin films grown on MgO and Si substrates, respectively. We observed the reversible elongation and co...
Autores principales: | Tan, Goon, Maruyama, Kazuki, Kanamitsu, Yuya, Nishioka, Shintaro, Ozaki, Tomoatsu, Umegaki, Toshihito, Hida, Hirotaka, Kanno, Isaku |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6514214/ https://www.ncbi.nlm.nih.gov/pubmed/31086266 http://dx.doi.org/10.1038/s41598-019-43869-1 |
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