Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy

Atomic force microscopy (AFM) can characterize nanomaterial elasticity. However, some one-dimensional nanomaterials, such as DNA, are too small to locate with an AFM tip because of thermal drift and the nonlinearity of piezoelectric actuators. In this study, we propose a novel approach to address th...

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Detalles Bibliográficos
Autores principales: Li, Longhai, Zhang, Xu, Wang, Hongfei, Lang, Qian, Chen, Haitao, Liu, Lian Qing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6523151/
https://www.ncbi.nlm.nih.gov/pubmed/30959929
http://dx.doi.org/10.3390/nano9040561

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6523151/
https://www.ncbi.nlm.nih.gov/pubmed/30959929
http://dx.doi.org/10.3390/nano9040561

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