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Structural and Thermal Characterisation of Nanofilms by Time-Resolved X-ray Scattering

High time resolution in scattering analysis of thin films allows for determination of thermal conductivity by transient pump-probe detection of dissipation of laser-induced heating, TDXTS. We describe an approach that analyses the picosecond-resolved lattice parameter reaction of a gold transducer l...

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Detalles Bibliográficos
Autores principales: Plech, Anton, Krause, Bärbel, Baumbach, Tilo, Zakharova, Margarita, Eon, Soizic, Girmen, Caroline, Buth, Gernot, Bracht, Hartmut
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6523543/
https://www.ncbi.nlm.nih.gov/pubmed/30939755
http://dx.doi.org/10.3390/nano9040501