Cargando…
New development of atomic layer deposition: processes, methods and applications
Atomic layer deposition (ALD) is an ultra-thin film deposition technique that has found many applications owing to its distinct abilities. They include uniform deposition of conformal films with controllable thickness, even on complex three-dimensional surfaces, and can improve the efficiency of ele...
Autores principales: | , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Taylor & Francis
2019
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6534251/ https://www.ncbi.nlm.nih.gov/pubmed/31164953 http://dx.doi.org/10.1080/14686996.2019.1599694 |
_version_ | 1783421375182012416 |
---|---|
author | Oviroh, Peter Ozaveshe Akbarzadeh, Rokhsareh Pan, Dongqing Coetzee, Rigardt Alfred Maarten Jen, Tien-Chien |
author_facet | Oviroh, Peter Ozaveshe Akbarzadeh, Rokhsareh Pan, Dongqing Coetzee, Rigardt Alfred Maarten Jen, Tien-Chien |
author_sort | Oviroh, Peter Ozaveshe |
collection | PubMed |
description | Atomic layer deposition (ALD) is an ultra-thin film deposition technique that has found many applications owing to its distinct abilities. They include uniform deposition of conformal films with controllable thickness, even on complex three-dimensional surfaces, and can improve the efficiency of electronic devices. This technology has attracted significant interest both for fundamental understanding how the new functional materials can be synthesized by ALD and for numerous practical applications, particularly in advanced nanopatterning for microelectronics, energy storage systems, desalinations, catalysis and medical fields. This review introduces the progress made in ALD, both for computational and experimental methodologies, and provides an outlook of this emerging technology in comparison with other film deposition methods. It discusses experimental approaches and factors that affect the deposition and presents simulation methods, such as molecular dynamics and computational fluid dynamics, which help determine and predict effective ways to optimize ALD processes, hence enabling the reduction in cost, energy waste and adverse environmental impacts. Specific examples are chosen to illustrate the progress in ALD processes and applications that showed a considerable impact on other technologies. |
format | Online Article Text |
id | pubmed-6534251 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | Taylor & Francis |
record_format | MEDLINE/PubMed |
spelling | pubmed-65342512019-06-04 New development of atomic layer deposition: processes, methods and applications Oviroh, Peter Ozaveshe Akbarzadeh, Rokhsareh Pan, Dongqing Coetzee, Rigardt Alfred Maarten Jen, Tien-Chien Sci Technol Adv Mater Engineering and Structural materials Atomic layer deposition (ALD) is an ultra-thin film deposition technique that has found many applications owing to its distinct abilities. They include uniform deposition of conformal films with controllable thickness, even on complex three-dimensional surfaces, and can improve the efficiency of electronic devices. This technology has attracted significant interest both for fundamental understanding how the new functional materials can be synthesized by ALD and for numerous practical applications, particularly in advanced nanopatterning for microelectronics, energy storage systems, desalinations, catalysis and medical fields. This review introduces the progress made in ALD, both for computational and experimental methodologies, and provides an outlook of this emerging technology in comparison with other film deposition methods. It discusses experimental approaches and factors that affect the deposition and presents simulation methods, such as molecular dynamics and computational fluid dynamics, which help determine and predict effective ways to optimize ALD processes, hence enabling the reduction in cost, energy waste and adverse environmental impacts. Specific examples are chosen to illustrate the progress in ALD processes and applications that showed a considerable impact on other technologies. Taylor & Francis 2019-05-23 /pmc/articles/PMC6534251/ /pubmed/31164953 http://dx.doi.org/10.1080/14686996.2019.1599694 Text en © 2019 The Author(s). Published by National Institute for Materials Science in partnership with Taylor & Francis Group. http://creativecommons.org/licenses/by/4.0/ This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. |
spellingShingle | Engineering and Structural materials Oviroh, Peter Ozaveshe Akbarzadeh, Rokhsareh Pan, Dongqing Coetzee, Rigardt Alfred Maarten Jen, Tien-Chien New development of atomic layer deposition: processes, methods and applications |
title | New development of atomic layer deposition: processes, methods and applications |
title_full | New development of atomic layer deposition: processes, methods and applications |
title_fullStr | New development of atomic layer deposition: processes, methods and applications |
title_full_unstemmed | New development of atomic layer deposition: processes, methods and applications |
title_short | New development of atomic layer deposition: processes, methods and applications |
title_sort | new development of atomic layer deposition: processes, methods and applications |
topic | Engineering and Structural materials |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6534251/ https://www.ncbi.nlm.nih.gov/pubmed/31164953 http://dx.doi.org/10.1080/14686996.2019.1599694 |
work_keys_str_mv | AT ovirohpeterozaveshe newdevelopmentofatomiclayerdepositionprocessesmethodsandapplications AT akbarzadehrokhsareh newdevelopmentofatomiclayerdepositionprocessesmethodsandapplications AT pandongqing newdevelopmentofatomiclayerdepositionprocessesmethodsandapplications AT coetzeerigardtalfredmaarten newdevelopmentofatomiclayerdepositionprocessesmethodsandapplications AT jentienchien newdevelopmentofatomiclayerdepositionprocessesmethodsandapplications |