Correction of Scanning Electron Microscope Imaging Artifacts in a Novel Digital Image Correlation Framework

The combination of digital image correlation (DIC) and scanning electron microscopy (SEM) enables to extract high resolution full field displacement data, based on the high spatial resolution of SEM and the sub-pixel accuracy of DIC. However, SEM images may exhibit a considerable amount of imaging a...

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Detalles Bibliográficos
Autores principales: Maraghechi, S., Hoefnagels, J. P. M., Peerlings, R. H. J., Rokoš, O., Geers, M. G. D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6541586/
https://www.ncbi.nlm.nih.gov/pubmed/31205321
http://dx.doi.org/10.1007/s11340-018-00469-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6541586/
https://www.ncbi.nlm.nih.gov/pubmed/31205321
http://dx.doi.org/10.1007/s11340-018-00469-w

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