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Correction of Scanning Electron Microscope Imaging Artifacts in a Novel Digital Image Correlation Framework
The combination of digital image correlation (DIC) and scanning electron microscopy (SEM) enables to extract high resolution full field displacement data, based on the high spatial resolution of SEM and the sub-pixel accuracy of DIC. However, SEM images may exhibit a considerable amount of imaging a...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer US
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6541586/ https://www.ncbi.nlm.nih.gov/pubmed/31205321 http://dx.doi.org/10.1007/s11340-018-00469-w |