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Scalable Epitaxial Growth of WSe(2) Thin Films on SiO(2)/Si via a Self-Assembled PtSe(2) Buffer Layer

The growth of large-area epitaxial transition metal dichalgogenides (TMDCs) are of central importance for scalable integrated device applications. Different methods have been developed to achieve large-sized high quality films. However, reliable approaches for centimeter-sized or even wafer-level ep...

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Detalles Bibliográficos
Autores principales: Wu, Pei-Chen, Yang, Chun-Liang, Du, Yuanmin, Lai, Chih-Huang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6541630/
https://www.ncbi.nlm.nih.gov/pubmed/31142782
http://dx.doi.org/10.1038/s41598-019-44518-3
Descripción
Sumario:The growth of large-area epitaxial transition metal dichalgogenides (TMDCs) are of central importance for scalable integrated device applications. Different methods have been developed to achieve large-sized high quality films. However, reliable approaches for centimeter-sized or even wafer-level epitaxial growth of TMDCs are still lacking. Here we demonstrate a new method to grow inch-sized epitaxial WSe(2) films on SiO(2)/Si substrates at a much lower temperature with high repeatability and scalability. High quality crystalline films are achieved through direct selenization of a tungsten film with platinum as the underlayer. The self-assembled PtSe(2) buffer layer, formed during selenization, assists epitaxial growth of WSe(2). Using fabricated WSe(2) films, excellent performance memory devices are demonstrated. As a member of the TMDC family, our findings based on WSe(2) may also be applied to other TMDC materials for large-scale production of high quality TMDC films for various applications.