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Scalable Epitaxial Growth of WSe(2) Thin Films on SiO(2)/Si via a Self-Assembled PtSe(2) Buffer Layer
The growth of large-area epitaxial transition metal dichalgogenides (TMDCs) are of central importance for scalable integrated device applications. Different methods have been developed to achieve large-sized high quality films. However, reliable approaches for centimeter-sized or even wafer-level ep...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6541630/ https://www.ncbi.nlm.nih.gov/pubmed/31142782 http://dx.doi.org/10.1038/s41598-019-44518-3 |
Sumario: | The growth of large-area epitaxial transition metal dichalgogenides (TMDCs) are of central importance for scalable integrated device applications. Different methods have been developed to achieve large-sized high quality films. However, reliable approaches for centimeter-sized or even wafer-level epitaxial growth of TMDCs are still lacking. Here we demonstrate a new method to grow inch-sized epitaxial WSe(2) films on SiO(2)/Si substrates at a much lower temperature with high repeatability and scalability. High quality crystalline films are achieved through direct selenization of a tungsten film with platinum as the underlayer. The self-assembled PtSe(2) buffer layer, formed during selenization, assists epitaxial growth of WSe(2). Using fabricated WSe(2) films, excellent performance memory devices are demonstrated. As a member of the TMDC family, our findings based on WSe(2) may also be applied to other TMDC materials for large-scale production of high quality TMDC films for various applications. |
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