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X-RAY EMISSION FROM MATERIALS PROCESSING LASERS
The emission of laser induced X-rays from materials processing ultra-short pulsed laser systems was measured. The absolute spectral photon fluence was determined using a thermoluminescence detector based few-channel spectrometer. The spectra at 10 cm from the laser focus were in the energy region be...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Oxford University Press
2019
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6543886/ https://www.ncbi.nlm.nih.gov/pubmed/30215786 http://dx.doi.org/10.1093/rpd/ncy126 |