Material structure, properties, and dynamics through scanning transmission electron microscopy

Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe-forming lens. Now, atomic-sized beams are routine, even at accelerating voltages as low as 40 kV, allowing knock-on damage to be minimized in b...

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Detalles Bibliográficos
Autores principales: Pennycook, Stephen J., Li, Changjian, Li, Mengsha, Tang, Chunhua, Okunishi, Eiji, Varela, Maria, Kim, Young-Min, Jang, Jae Hyuck
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Berlin Heidelberg 2018
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6560782/
https://www.ncbi.nlm.nih.gov/pubmed/31258949
http://dx.doi.org/10.1186/s40543-018-0142-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6560782/
https://www.ncbi.nlm.nih.gov/pubmed/31258949
http://dx.doi.org/10.1186/s40543-018-0142-4

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