Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry

A chip-based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micrometers to nanometers after fast thermal treatments becomes accessible. An FSC can treat the sample isothermally or at heatin...

Descripción completa

Detalles Bibliográficos
Autores principales: Zhang, Rui, Zhuravlev, Evgeny, Androsch, René, Schick, Christoph
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6572680/
https://www.ncbi.nlm.nih.gov/pubmed/31096647
http://dx.doi.org/10.3390/polym11050890

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6572680/
https://www.ncbi.nlm.nih.gov/pubmed/31096647
http://dx.doi.org/10.3390/polym11050890

Ejemplares similares