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Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry

A chip-based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micrometers to nanometers after fast thermal treatments becomes accessible. An FSC can treat the sample isothermally or at heatin...

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Detalles Bibliográficos
Autores principales:	Zhang, Rui, Zhuravlev, Evgeny, Androsch, René, Schick, Christoph
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2019
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6572680/ https://www.ncbi.nlm.nih.gov/pubmed/31096647 http://dx.doi.org/10.3390/polym11050890

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