No-Reference Quality Assessment Method for Blurriness of SEM Micrographs with Multiple Texture

Scanning electron microscopy (SEM) plays an important role in the intuitive understanding of microstructures because it can provide ultrahigh magnification. Tens or hundreds of images are regularly generated and saved during a typical microscopy imaging process. Given the subjectivity of a microscop...

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Detalles Bibliográficos
Autores principales: Wang, Hui, Hu, Xiaojuan, Xu, Hui, Li, Shiyin, Lu, Zhaolin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2019
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6589194/
https://www.ncbi.nlm.nih.gov/pubmed/31281563
http://dx.doi.org/10.1155/2019/4271761

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6589194/
https://www.ncbi.nlm.nih.gov/pubmed/31281563
http://dx.doi.org/10.1155/2019/4271761

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