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No-Reference Quality Assessment Method for Blurriness of SEM Micrographs with Multiple Texture
Scanning electron microscopy (SEM) plays an important role in the intuitive understanding of microstructures because it can provide ultrahigh magnification. Tens or hundreds of images are regularly generated and saved during a typical microscopy imaging process. Given the subjectivity of a microscop...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Hindawi
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6589194/ https://www.ncbi.nlm.nih.gov/pubmed/31281563 http://dx.doi.org/10.1155/2019/4271761 |