Thickness-Dependent Perovskite Octahedral Distortions at Heterointerfaces

[Image: see text] In this study, we analyze how the octahedral tilts and rotations of thin films of LaNiO(3) and LaAlO(3) grown on different substrates, determined using synchrotron X-ray diffraction-measured half-integer Bragg peaks, depend upon the total film thickness. We find a striking differen...

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Detalles Bibliográficos
Autores principales: Fowlie, Jennifer, Lichtensteiger, Céline, Gibert, Marta, Meley, Hugo, Willmott, Philip, Triscone, Jean-Marc
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2019
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6595436/
https://www.ncbi.nlm.nih.gov/pubmed/31117765
http://dx.doi.org/10.1021/acs.nanolett.9b01772

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6595436/
https://www.ncbi.nlm.nih.gov/pubmed/31117765
http://dx.doi.org/10.1021/acs.nanolett.9b01772

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