Identification of Loci and Candidate Genes Responsible for Pod Dehiscence in Soybean via Genome-Wide Association Analysis Across Multiple Environments

Pod dehiscence (shattering) is the main cause of serious yield loss during the soybean mechanical harvesting process. A better understanding of the genetic architecture and molecular mechanisms of pod dehiscence is of great significance for soybean breeding. In this study, genome-wide association an...

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Detalles Bibliográficos
Autores principales: Hu, Dezhou, Kan, Guizhen, Hu, Wei, Li, Yali, Hao, Derong, Li, Xiao, Yang, Hui, Yang, Zhongyi, He, Xiaohong, Huang, Fang, Yu, Deyue
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2019
Materias:
Plant Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6598122/
https://www.ncbi.nlm.nih.gov/pubmed/31293609
http://dx.doi.org/10.3389/fpls.2019.00811

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6598122/
https://www.ncbi.nlm.nih.gov/pubmed/31293609
http://dx.doi.org/10.3389/fpls.2019.00811

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