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Confocal photoluminescence investigation to identify basal stacking fault’s role in the optical properties of semi-polar InGaN/GaN lighting emitting diodes
High spatial-resolution confocal photoluminescence (PL) measurements have been performed on a series of semi-polar (11–22) InGaN light emitting diodes (LEDs) with emission wavelengths up to yellow. These LED samples have been grown on our high crystal quality semi-polar GaN templates which feature p...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6611846/ https://www.ncbi.nlm.nih.gov/pubmed/31278338 http://dx.doi.org/10.1038/s41598-019-46292-8 |