Wavefront sensing at X-ray free-electron lasers

Here a direct comparison is made between various X-ray wavefront sensing methods with application to optics alignment and focus characterization at X-ray free-electron lasers (XFELs). Focus optimization at XFEL beamlines presents unique challenges due to high peak powers as well as beam pointing ins...

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Detalles Bibliográficos
Autores principales: Seaberg, Matthew, Cojocaru, Ruxandra, Berujon, Sebastien, Ziegler, Eric, Jaggi, Andreas, Krempasky, Juraj, Seiboth, Frank, Aquila, Andrew, Liu, Yanwei, Sakdinawat, Anne, Lee, Hae Ja, Flechsig, Uwe, Patthey, Luc, Koch, Frieder, Seniutinas, Gediminas, David, Christian, Zhu, Diling, Mikeš, Ladislav, Makita, Mikako, Koyama, Takahisa, Mancuso, Adrian P., Chapman, Henry N., Vagovič, Patrik
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6613120/
https://www.ncbi.nlm.nih.gov/pubmed/31274435
http://dx.doi.org/10.1107/S1600577519005721

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6613120/
https://www.ncbi.nlm.nih.gov/pubmed/31274435
http://dx.doi.org/10.1107/S1600577519005721

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