Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system

The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit....

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Detalles Bibliográficos
Autores principales: Osterhoff, Markus, Robisch, Anna-Lena, Soltau, Jakob, Eckermann, Marina, Kalbfleisch, Sebastian, Carbone, Dina, Johansson, Ulf, Salditt, Tim
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6613126/
https://www.ncbi.nlm.nih.gov/pubmed/31274441
http://dx.doi.org/10.1107/S1600577519003886

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6613126/
https://www.ncbi.nlm.nih.gov/pubmed/31274441
http://dx.doi.org/10.1107/S1600577519003886

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