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Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system
The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit....
Autores principales: | Osterhoff, Markus, Robisch, Anna-Lena, Soltau, Jakob, Eckermann, Marina, Kalbfleisch, Sebastian, Carbone, Dina, Johansson, Ulf, Salditt, Tim |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6613126/ https://www.ncbi.nlm.nih.gov/pubmed/31274441 http://dx.doi.org/10.1107/S1600577519003886 |
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