Peak calling by Sparse Enrichment Analysis for CUT&RUN chromatin profiling

BACKGROUND: CUT&RUN is an efficient epigenome profiling method that identifies sites of DNA binding protein enrichment genome-wide with high signal to noise and low sequencing requirements. Currently, the analysis of CUT&RUN data is complicated by its exceptionally low background, which rend...

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Detalles Bibliográficos
Autores principales: Meers, Michael P., Tenenbaum, Dan, Henikoff, Steven
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2019
Materias:
Methodology
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6624997/
https://www.ncbi.nlm.nih.gov/pubmed/31300027
http://dx.doi.org/10.1186/s13072-019-0287-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6624997/
https://www.ncbi.nlm.nih.gov/pubmed/31300027
http://dx.doi.org/10.1186/s13072-019-0287-4

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