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Peak calling by Sparse Enrichment Analysis for CUT&RUN chromatin profiling
BACKGROUND: CUT&RUN is an efficient epigenome profiling method that identifies sites of DNA binding protein enrichment genome-wide with high signal to noise and low sequencing requirements. Currently, the analysis of CUT&RUN data is complicated by its exceptionally low background, which rend...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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BioMed Central
2019
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6624997/ https://www.ncbi.nlm.nih.gov/pubmed/31300027 http://dx.doi.org/10.1186/s13072-019-0287-4 |