Measurement of Diffusion and Segregation in Semiconductor Quantum Dots and Quantum Wells by Transmission Electron Microscopy: A Guide

Strategies are discussed to distinguish interdiffusion and segregation and to measure key parameters such as diffusivities and segregation lengths in semiconductor quantum dots and quantum wells by electron microscopy methods. Spectroscopic methods are usually necessary when the materials systems ar...

Descripción completa

Detalles Bibliográficos
Autor principal: Walther, Thomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6630582/
https://www.ncbi.nlm.nih.gov/pubmed/31181748
http://dx.doi.org/10.3390/nano9060872

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6630582/
https://www.ncbi.nlm.nih.gov/pubmed/31181748
http://dx.doi.org/10.3390/nano9060872

Ejemplares similares