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Optical nonlinearities in ultra-silicon-rich nitride characterized using z-scan measurements

The dispersive nonlinear refractive index of ultra-silicon-rich nitride, and its two-photon and three-photon absorption coefficients are measured in the wavelength range between 0.8 µm–1.6 µm, covering the O- to L – telecommunications bands. In the two-photon absorption range, the measured nonlinear...

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Detalles Bibliográficos
Autores principales: Sohn, Byoung-Uk, Choi, Ju Won, Ng, Doris K. T., Tan, Dawn T. H.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6637241/
https://www.ncbi.nlm.nih.gov/pubmed/31316096
http://dx.doi.org/10.1038/s41598-019-46865-7