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Rapid Evaluation of Electron Mobilities at Semiconductor–Insulator Interfaces in an Ambient Atmosphere by a Contactless Microwave-Based Technique

[Image: see text] Intrinsic mobility of electrons at the interfaces between crystalline organic semiconductors and insulating dielectric polymer films was rapidly evaluated in an ambient atmosphere by TRMC@Interfaces, a noncontact and nondestructive method based on dielectric loss spectroscopy of mi...

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Detalles Bibliográficos
Autores principales: Inoue, Junichi, Tsutsui, Yusuke, Choi, Wookjin, Kubota, Kai, Sakurai, Tsuneaki, Seki, Shu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2017
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6640973/
https://www.ncbi.nlm.nih.gov/pubmed/31457218
http://dx.doi.org/10.1021/acsomega.6b00428