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Rapid Evaluation of Electron Mobilities at Semiconductor–Insulator Interfaces in an Ambient Atmosphere by a Contactless Microwave-Based Technique
[Image: see text] Intrinsic mobility of electrons at the interfaces between crystalline organic semiconductors and insulating dielectric polymer films was rapidly evaluated in an ambient atmosphere by TRMC@Interfaces, a noncontact and nondestructive method based on dielectric loss spectroscopy of mi...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2017
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6640973/ https://www.ncbi.nlm.nih.gov/pubmed/31457218 http://dx.doi.org/10.1021/acsomega.6b00428 |