Formation Mechanism of Secondary Electron Contrast of Graphene Layers on a Metal Substrate

[Image: see text] Scanning electron microscopy (SEM) is widely used to observe graphene on metal substrates. However, the origin of the SEM image contrast of graphene is not well understood. In this work, we performed in situ SEM imaging of layer-number-controlled graphene on a Ni substrate using a...

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Detalles Bibliográficos
Autores principales: Shihommatsu, Kota, Takahashi, Junro, Momiuchi, Yuta, Hoshi, Yudai, Kato, Hiroki, Homma, Yoshikazu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2017
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6645151/
https://www.ncbi.nlm.nih.gov/pubmed/31457340
http://dx.doi.org/10.1021/acsomega.7b01550

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6645151/
https://www.ncbi.nlm.nih.gov/pubmed/31457340
http://dx.doi.org/10.1021/acsomega.7b01550

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