Operando Analysis of Electron Devices Using Nanodiamond Thin Films Containing Nitrogen-Vacancy Centers

[Image: see text] Operando analysis of electron devices provides key information regarding their performance enhancement, reliability, thermal management, etc. For versatile operando analysis of devices, the nitrogen-vacancy (NV) centers in diamonds are potentially useful media owing to their excell...

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Detalles Bibliográficos
Autores principales: Uchiyama, Haruki, Saijo, Soya, Kishimoto, Shigeru, Ishi-Hayase, Junko, Ohno, Yutaka
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2019
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6648530/
https://www.ncbi.nlm.nih.gov/pubmed/31459842
http://dx.doi.org/10.1021/acsomega.9b00344

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6648530/
https://www.ncbi.nlm.nih.gov/pubmed/31459842
http://dx.doi.org/10.1021/acsomega.9b00344

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