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Operando Analysis of Electron Devices Using Nanodiamond Thin Films Containing Nitrogen-Vacancy Centers

[Image: see text] Operando analysis of electron devices provides key information regarding their performance enhancement, reliability, thermal management, etc. For versatile operando analysis of devices, the nitrogen-vacancy (NV) centers in diamonds are potentially useful media owing to their excell...

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Detalles Bibliográficos
Autores principales:	Uchiyama, Haruki, Saijo, Soya, Kishimoto, Shigeru, Ishi-Hayase, Junko, Ohno, Yutaka
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	American Chemical Society 2019
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6648530/ https://www.ncbi.nlm.nih.gov/pubmed/31459842 http://dx.doi.org/10.1021/acsomega.9b00344

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