Applying Speckle Noise Suppression to Refractive Indices Change Detection in Porous Silicon Microarrays

The gray value method can be used to detect gray value changes of each unit almost parallel to the surface image of PSi (porous silicon) microarrays and indirectly measure the refractive index changes of each unit. However, the speckles of different noise intensities produced by lasers on a porous s...

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Detalles Bibliográficos
Autores principales: Ren, Ruyong, Jia, Zhenhong, Yang, Jie, Kasabov, Nikola
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6651720/
https://www.ncbi.nlm.nih.gov/pubmed/31284494
http://dx.doi.org/10.3390/s19132975

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6651720/
https://www.ncbi.nlm.nih.gov/pubmed/31284494
http://dx.doi.org/10.3390/s19132975

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