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Characterizing the Manifest Probability Distributions of Three Latent Trait Models for Accuracy and Response Time
In this paper we study the statistical relations between three latent trait models for accuracies and response times: the hierarchical model (HM) of van der Linden (Psychometrika 72(3):287–308, 2007), the signed residual time model (SM) proposed by Maris and van der Maas (Psychometrika 77(4):615–633...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6658587/ https://www.ncbi.nlm.nih.gov/pubmed/30919229 http://dx.doi.org/10.1007/s11336-019-09668-3 |