Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy

Control of local lattice perturbations near optically-active defects in semiconductors is a key step to harnessing the potential of solid-state qubits for quantum information science and nanoscale sensing. We report the development of a stroboscopic scanning X-ray diffraction microscopy approach for...

Descripción completa

Detalles Bibliográficos
Autores principales: Whiteley, S. J., Heremans, F. J., Wolfowicz, G., Awschalom, D. D., Holt, M. V.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6662806/
https://www.ncbi.nlm.nih.gov/pubmed/31358776
http://dx.doi.org/10.1038/s41467-019-11365-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6662806/
https://www.ncbi.nlm.nih.gov/pubmed/31358776
http://dx.doi.org/10.1038/s41467-019-11365-9

Ejemplares similares