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Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy

Control of local lattice perturbations near optically-active defects in semiconductors is a key step to harnessing the potential of solid-state qubits for quantum information science and nanoscale sensing. We report the development of a stroboscopic scanning X-ray diffraction microscopy approach for...

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Detalles Bibliográficos
Autores principales:	Whiteley, S. J., Heremans, F. J., Wolfowicz, G., Awschalom, D. D., Holt, M. V.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group UK 2019
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6662806/ https://www.ncbi.nlm.nih.gov/pubmed/31358776 http://dx.doi.org/10.1038/s41467-019-11365-9

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