Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes

Atomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the...

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Detalles Bibliográficos
Autores principales: Xia, Fangzhou, Yang, Chen, Wang, Yi, Youcef-Toumi, Kamal, Reuter, Christoph, Ivanov, Tzvetan, Holz, Mathias, Rangelow, Ivo W.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6669515/
https://www.ncbi.nlm.nih.gov/pubmed/31337145
http://dx.doi.org/10.3390/nano9071013

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6669515/
https://www.ncbi.nlm.nih.gov/pubmed/31337145
http://dx.doi.org/10.3390/nano9071013

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