Native Point Defect Measurement and Manipulation in ZnO Nanostructures

This review presents recent research advances in measuring native point defects in ZnO nanostructures, establishing how these defects affect nanoscale electronic properties, and developing new techniques to manipulate these defects to control nano- and micro- wire electronic properties. From spatial...

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Detalles Bibliográficos
Autores principales: Brillson, Leonard, Cox, Jonathan, Gao, Hantian, Foster, Geoffrey, Ruane, William, Jarjour, Alexander, Allen, Martin, Look, David, von Wenckstern, Holger, Grundmann, Marius
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6678356/
https://www.ncbi.nlm.nih.gov/pubmed/31336831
http://dx.doi.org/10.3390/ma12142242

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6678356/
https://www.ncbi.nlm.nih.gov/pubmed/31336831
http://dx.doi.org/10.3390/ma12142242

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