Cargando…
In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM
Scanning electron microscopes come equipped with different types of detectors for the collection of signal electrons emitted from samples. In-lens detection systems mostly consist of several auxiliary electrodes that help electrons to travel in a direction towards the detector. This paper aims to sh...
| Autores principales: | , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2019
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6679021/ https://www.ncbi.nlm.nih.gov/pubmed/31330942 http://dx.doi.org/10.3390/ma12142307 |