Stationary beam full-field transmission helium ion microscopy using sub-50 keV He(+): Projected images and intensity patterns

A dedicated transmission helium ion microscope (THIM) for sub-50 keV helium has been constructed to investigate ion scattering processes and contrast mechanisms, aiding the development of new imaging and analysis modalities. Unlike a commercial helium ion microscope (HIM), the in-house built instrum...

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Detalles Bibliográficos
Autores principales: Mousley, Michael, Eswara, Santhana, De Castro, Olivier, Bouton, Olivier, Klingner, Nico, Koch, Christoph T, Hlawacek, Gregor, Wirtz, Tom
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2019
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6693417/
https://www.ncbi.nlm.nih.gov/pubmed/31467826
http://dx.doi.org/10.3762/bjnano.10.160

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6693417/
https://www.ncbi.nlm.nih.gov/pubmed/31467826
http://dx.doi.org/10.3762/bjnano.10.160

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