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Stationary beam full-field transmission helium ion microscopy using sub-50 keV He(+): Projected images and intensity patterns
A dedicated transmission helium ion microscope (THIM) for sub-50 keV helium has been constructed to investigate ion scattering processes and contrast mechanisms, aiding the development of new imaging and analysis modalities. Unlike a commercial helium ion microscope (HIM), the in-house built instrum...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6693417/ https://www.ncbi.nlm.nih.gov/pubmed/31467826 http://dx.doi.org/10.3762/bjnano.10.160 |