An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner

This paper introduces a three-dimensional (3D) point cloud data obtained method based on a laser line scanner and data processing technology via a PCL open project. This paper also provides a systematical analysis of the error types of laser line scanner and common error reducing solutions and calib...

Descripción completa

Detalles Bibliográficos
Autores principales: Li, Jianxiong, Zhou, Qian, Li, Xinghui, Chen, Ruiming, Ni, Kai
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6695628/
https://www.ncbi.nlm.nih.gov/pubmed/31382454
http://dx.doi.org/10.3390/s19153398

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6695628/
https://www.ncbi.nlm.nih.gov/pubmed/31382454
http://dx.doi.org/10.3390/s19153398

Ejemplares similares