Fast and robust phase-shift estimation in two-dimensional structured illumination microscopy

A method of determining unknown phase-shifts between elementary images in two-dimensional Structured Illumination Microscopy (2D-SIM) is presented. The proposed method is based on the comparison of the peak intensity of spectral components. These components correspond to the inherent structured illu...

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Detalles Bibliográficos
Autores principales: Sola-Pikabea, Jorge, Garcia-Rius, Arcadi, Saavedra, Genaro, Garcia-Sucerquia, Jorge, Martínez-Corral, Manuel, Sánchez-Ortiga, Emilio
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2019
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6697343/
https://www.ncbi.nlm.nih.gov/pubmed/31419247
http://dx.doi.org/10.1371/journal.pone.0221254

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6697343/
https://www.ncbi.nlm.nih.gov/pubmed/31419247
http://dx.doi.org/10.1371/journal.pone.0221254

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