Resolution enhancement in scanning electron microscopy using deep learning

We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in low-resolution SEM images and comparing them with the accuratel...

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Detalles Bibliográficos
Autores principales: de Haan, Kevin, Ballard, Zachary S., Rivenson, Yair, Wu, Yichen, Ozcan, Aydogan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6700066/
https://www.ncbi.nlm.nih.gov/pubmed/31427691
http://dx.doi.org/10.1038/s41598-019-48444-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6700066/
https://www.ncbi.nlm.nih.gov/pubmed/31427691
http://dx.doi.org/10.1038/s41598-019-48444-2

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